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dc.contributor.author柳兆洪
dc.contributor.author陈谋智
dc.contributor.author王余姜
dc.contributor.author孙书农
dc.contributor.author黄美纯
dc.date.accessioned2011-06-19T05:16:38Z
dc.date.available2011-06-19T05:16:38Z
dc.date.issued1999-09
dc.identifier.citation发光学报,1999(3):207-211zh_CN
dc.identifier.issn1000-7032
dc.identifier.urihttps://dspace.xmu.edu.cn/handle/2288/9621
dc.description.abstract【中文摘要】 对硫化锌未灼烧的原粉、灼烧两次的粉料及分舟热蒸发研制的掺铒硫化锌电致发光薄膜器件, 用X射线衍射(XRD)、X射线光电子能谱(XPS)和发光亮度测试技术, 测量硫化锌原粉、粉料、薄膜的表面及内部构态, 获得微晶薄膜构态与发光中心浓度和发光亮度关系的信息. 薄膜多晶的沉积有择优取向的趋势; 对(311)、(400)这些高指数的晶面, 置换需要的能量相对较小, 稀土较容易置换这些晶粒格点上的Zn2+ , 形成稀土发光中心; 高指数的晶面上的晶粒尺寸如增大, 它的发光强度将增强. 【英文摘要】 The surface and internal structure states of commercially available ZnS powder, twice heated powder and the ZnS∶Er 3+ thin film material prepared by evaporating with two boats, are measured by using X ray diffraction(XRD), X ray photoelectron spectroscopy(XPS) and electroluminescence brightness measurement techniques. The information of the relation between the microstructure and the concentration of luminescent centers in the film was obtained. The experimental results show that the deposited polycr...zh_CN
dc.description.sponsorship福建省自然科学基金zh_CN
dc.language.isozhzh_CN
dc.publisher《发光学报》编辑部zh_CN
dc.subject电致发光zh_CN
dc.subject微晶薄膜zh_CN
dc.subject发光中心zh_CN
dc.subjectelectroluminescencezh_CN
dc.subjectmicrocrystallite thin filmzh_CN
dc.subjectluminescent centerszh_CN
dc.title掺铒硫化锌薄膜的结构与发光zh_CN
dc.title.alternativeMICROSTRUCTURE AND LUMINESCENCE IN ZINC SULFIDE THIN FILMS DOPED WITH ERBIUMzh_CN
dc.typeArticlezh_CN


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