GAT实现高频率与高基区穿通电压兼容特性分析
An Analysis of GATs Compatibility Between High Frequency and High Base Region Punchthrough Voltage
Abstract
【中文摘要】 通过作者最近建立的关于 GAT器件集电结耗尽层电位分布和电场分布的二维解析模型 ,定量研究了 GAT的基区穿通电压 VPI,并且解释了该器件实现高频率与高电压兼容的实验结果。
【英文摘要】 By the aid of the two dimensional analytical model of the electric potential and field distribution in GATs collector depletion space in a cut off state which was established by the writers lately,the GATs base region punchthrough voltage V PI was investigated quantitatively,and the experimental results which concluded that the GATs can realize the compatibility between high frequency and high voltage were explained.