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Defects and electrical properties of crystalline silicon at different metallurgical route 

Lai, Hui Xian; Huang, Liu Qing; Fang, Ming; Lu, Cheng Hao; Chen, Juan; Yu, De Qin; Li, Jin Tang; Ma, Wen Hui; Shen, Jian Ning; Sheng, Zhi Lin; Luo, Xue Tao; 罗学涛 (Trans Tech Publications Ltd, 2013)
To investigate the effects of the metallurgical route on the defects in mc-Si, various metallurgical routes were conducted. Dislocation formation and the resistivity of the mc-Si were also studied. The results showed that ...

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AuthorChen, Juan (1)
Fang, Ming (1)
Huang, Liu Qing (1)Lai, Hui Xian (1)Li, Jin Tang (1)... View MoreSubjectDefects (1)
Dislocations (crystals) (1)
Electric conductivity (1)
Feedstocks (1)
Ingots (1)... View MoreDate Issued2013 (1)

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