Now showing items 1-1 of 1

    • Raman spectroscopic studies of the formation processes of cobalt silicide thin films 

      F.M.Liu; J.H.Ye; B.Ren; 任斌; Z.L.Yang; Y.Y.Liao; A.See; L.Chan; Z.Q.Tian; 田中群 (ELSEVIER SCIENCE SA, 2004-07)
      A confocal Raman system combined with a high-temperature furnace cell has been established to monitor the formation of cobalt silicides. This system enables the quasi in situ study of the influence of temperature, annealing ...