Show simple item record

dc.contributor.authorZhuang, MuDezh_CN
dc.contributor.authorLiu, Zhengzh_CN
dc.contributor.authorRen, Binzh_CN
dc.contributor.authorTian, ZhongQunzh_CN
dc.contributor.author田中群zh_CN
dc.date.accessioned2011-04-26T08:03:17Z
dc.date.available2011-04-26T08:03:17Z
dc.date.issued2010-02zh_CN
dc.identifier.citationSCIENCE CHINA Chemistry 2010,53(2): 426-431zh_CN
dc.identifier.issn1674-7291zh_CN
dc.identifier.urihttp://dx.doi.org/doi:10.1007/s11426-010-0068-1zh_CN
dc.identifier.urihttps://dspace.xmu.edu.cn/handle/2288/2151
dc.description.abstractTip-enhanced Raman spectroscopy (TERS) has been used to obtain the Raman signal of surface species on silicon single crystal surfaces without the necessity for surface enhancement by addition of Ag nanoparticles. By illuminating the hydrogen-terminated silicon surface covered with a droplet of 4-vinylpyridine with UV light, a 4-ethylpyridine modified silicon surface can be easily obtained. By bringing a scanning tunneling microscope (STM) Au tip with a nanoscale tip apex to a distance of ca. 1 nm from the modified silicon surface, enhanced Raman signals of the silicon phonon vibrations and the surface-bonded 4-ethylpyridine were obtained. The Raman enhancement factor was estimated to be close to 10(7). By comparing the surface-enhanced Raman scattering (SERS) signal obtained after surface enhancement with Ag nanoparticles and the TERS signal of the surface, the advantage of TERS over SERS for characterizing the surface species on substrates becomes apparent: TERS readily affords vibrational information about the system without disturbing it by surface enhancement. In this sense, TERS can be considered a truly non-invasive tool which is ideal for characterizing the actual surface species on substrates.zh_CN
dc.description.sponsorshipNational Natural Science Foundation of China [20673086, 20827003, 20825313]; 973 Program [2009CB930703, 2007CB935603]; Fok Ying Tung Foundation [101015]zh_CN
dc.language.isoenzh_CN
dc.publisherSCIENCE CHINA PRESSzh_CN
dc.subjecttip-enhanced Raman spectroscopyzh_CN
dc.subjectsilicon single crystalzh_CN
dc.subject4-ethylpyridinezh_CN
dc.subjectsurface modificationzh_CN
dc.titleSurface bonding on silicon surfaces as probed by tip-enhanced Raman spectroscopyzh_CN
dc.typeArticlezh_CN


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record