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dc.contributor.author刘进轩zh_CN
dc.contributor.author向娟zh_CN
dc.contributor.author田中群zh_CN
dc.contributor.author毛秉伟zh_CN
dc.date.accessioned2013-06-17T01:19:04Z
dc.date.available2013-06-17T01:19:04Z
dc.date.issued2004-03-10zh_CN
dc.identifier.citation电化学, 2004, (01): 20-26zh_CN
dc.identifier.urihttps://dspace.xmu.edu.cn/handle/2288/21367
dc.description.abstract 应用电沉积方法制备两种低粗糙度、具有导电/绝缘交接结构的测量基底—Au/CuO和HOPG/CuO,并在带导电针尖的原子力显微测量(CT_AFM)平台上建立了简便的一维纳米材料轴向电子输运性质测量方法.在大气室温条件下,对组装在两种基底上的单束碳纳米管轴向电学性质进行了定性测量,结果表明,该碳纳米管呈现金属性.zh_CN
dc.language.isozhzh_CN
dc.source.urihttp://epub.cnki.net/grid2008/brief/detailj.aspx?filename=DHXX200401004&dbname=CJFQ2004zh_CN
dc.subject一维纳米材料zh_CN
dc.subjectCT_AFMzh_CN
dc.subjectI_E特性曲线zh_CN
dc.subject碳纳米管zh_CN
dc.title电沉积法制备用于一维纳米材料电子输运性质测量的基底zh_CN
dc.typeArticlezh_CN


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