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dc.contributor.advisor陈松岩
dc.contributor.author郭振雄
dc.date.accessioned2018-12-05T01:46:24Z
dc.date.available2018-12-05T01:46:24Z
dc.date.issued2017-12-28
dc.identifier.urihttps://dspace.xmu.edu.cn/handle/2288/170377
dc.description.abstract近年来,伴随着电子信息产业的蓬勃发展,薄膜场效应管液晶显示屏(ThinFilmTransistor-LiquidCrystalDisplay,TFT-LCD)的工艺技术也不断进步和提升,使得液晶外围电极线路的尺寸越来越小,已达到微米数量级,相应的缺陷尺寸缩小至亚微米量级。为满足TFT-LCD高质量高效率的生产要求,AOI(AutomaticOpticInspection)技术已开始用于TFT-LCD缺陷检测的相关工艺中,用来取代传统人工目视检测。而国内用于液晶屏电极线路检测的AOI研究尚未见报道,AOI设备主要依赖国外进口。因此弥补TFT-LCD外围电极线路缺陷检测技术的缺失,实现TFT-LC...
dc.description.abstractIn recent years, with the rapid development of electronic information industry, TFT-LCD (Thin Film Transistor-Liquid Crystal Display) technology continues to progress and improve, making the size of LCD-defect down to sub micron level. In order to meet the requirements of high quality and high efficiency of TFT-LCD, AOI (Automatic Optic Inspection) technology has been used in the process of TFT-LC...
dc.language.isozh_CN
dc.relation.urihttps://catalog.xmu.edu.cn/opac/openlink.php?strText=58642&doctype=ALL&strSearchType=callno
dc.source.urihttps://etd.xmu.edu.cn/detail.asp?serial=62489
dc.subject自动光学检测
dc.subjectTFT-LCD电极线路检测
dc.subject自动对焦
dc.subject粒子群算法
dc.subjectAOI
dc.subjectTFT-LCDTFT-LCD defect detection
dc.subjectauto focus
dc.subjectSPSO
dc.title一种TFT-LCD电极线路缺陷检测的AOI设备控制系统的研发与设计
dc.title.alternativeDesign and development of a AOI device control system for TFT-LCD electrode line defect detection
dc.typethesis
dc.date.replied2017-05-19
dc.description.note学位:工学硕士
dc.description.note院系专业:物理科学与技术学院_工程硕士(电子与通信工程)
dc.description.note学号:19820141152985


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