Transient Thermal Resistance Test of Single-Crystal-Silicon Solar Cell
- 物理技术－已发表论文 
This paper reports the measurement of the junction temperature and the determination of the thermal resistance of the single-crystal-silicon solar cell under the dark and illuminating conditions, respectively. Under the dark condition, the solar cell is considered as a conventional p-n junction and is subject to a reverse current in order to measure its junction temperature and determine the thermal resistance. A white LED array is used as the light source to operate the solar cell in order to avoid the heating effect of the infrared light by the solar simulator. Furthermore, we thoroughly calculate the thermal dissipation power. The result demonstrates that the thermal resistance drops from 3.7 to 2.0 K/W with the increase of the irradiance from 89.6 to 194.3 W/m(2). It is also found that the thermal resistance under the dark condition is much higher than that under the illuminating condition, which is attributed to the light effect on the thermal resistance.
CitationIEEE TRANSACTIONS ON ELECTRON DEVICES，2012,59（9）：2345-2349