High-resolution spectra of selected rare earth elements and spectral interferences studied by inductively coupled plasma-atomic emission spectroscopy (ICP-AES)
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The rare earth elements (REEs) play very important roles in industrial manufacturing, technology development and biological processes. Due to their complex emission spectra, trace levels of REEs are difficult to analyze by conventional ICP-AES techniques. The present study investigates possible spectral interferences of matrices (rare earth oxides of Ce, Pr, Nd, Sm and Dy) on the analytical lines (+/- 0.1 nm) of a target REE. Detailed and well-resolved spectra for selected REEs are presented, and procedures used to rectify the problem of spectral interferences caused by REE matrices are discussed. A computer-assisted system (GAS) for spectral recognition has been developed and used to assist in the study of matrix interference. To determine directly trace rare earth elements in REE matrices without sample pre-separation, the application potential is demonstrated with a one meter sequential instrument retrofitted with a 3600 grooves/mm grating. (C) 1997 Elsevier Science B.V.