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dc.contributor.authorWilliams, CT
dc.contributor.authorYang, Y
dc.contributor.author杨勇
dc.contributor.authorBain, CD
dc.date.accessioned2012-06-29T06:11:17Z
dc.date.available2012-06-29T06:11:17Z
dc.date.issued2000-01-14
dc.identifier.citationLangmuir, 2000, 16 (5): 2343–2350zh_CN
dc.identifier.issn0743-7463
dc.identifier.urihttp://dx.doi.org/doi:10.1021/la991009l
dc.identifier.urihttps://dspace.xmu.edu.cn/handle/2288/13024
dc.description.abstractTotal internal reflection sum-frequency spectroscopy (TIR-SFS) is shown to be capable of detecting molecules adsorbed on ultrathin gold films (less than or equal to 10 nm) deposited on a sapphire prism. Octadecanethiol (ODT) and thiocyanate (SCN-) were used as probe molecules in order to assess the usefulness of the approach. For ODT adsorbed on 5-nm Au films, SF signal enhancements of over an order of magnitude were observed with TIR-SFS compared to the standard external reflection geometry. While TIR-SF spectra were obtained for ODT on 5- and 10-nm Au films, no molecular signals were detected for 20-nm Au films. The C=N stretch of SCN- adsorbed on a 5-nm Au film was detected by TIR-SFS in the presence of either water or air. A theoretical model is presented to rationalize the different SF signal levels observed under various conditions. Future prospects of TIR-SFS for studying other oxide-supported metals are discussed, along with possible applications in the fields of heterogeneous catalysis and electrochemistry.zh_CN
dc.language.isoenzh_CN
dc.publisherAMER CHEMICAL SOCzh_CN
dc.titleTotal internal reflection sum-frequency spectroscopy: A strategy for studying molecular adsorption on metal surfaceszh_CN
dc.typeArticlezh_CN


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