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dc.contributor.authorShi, CH
dc.contributor.authorCai, XW
dc.contributor.authorChen, YA
dc.contributor.authorChen, YX
dc.contributor.authorTian, ZQ
dc.contributor.author田中群
dc.contributor.authorMao, BW
dc.contributor.author毛秉伟
dc.date.accessioned2012-06-22T00:41:32Z
dc.date.available2012-06-22T00:41:32Z
dc.date.issued2000-06-06
dc.identifier.citationAPPLIED SURFACE SCIENCE,2000,158(1-2):11-15zh_CN
dc.identifier.issn0169-4332
dc.identifier.urihttp://dx.doi.org/10.1016/S0169-4332(99)00570-X
dc.identifier.urihttps://dspace.xmu.edu.cn/handle/2288/12929
dc.description.abstractWe demonstrate some unique properties of a rough silver electrode surface revealed by the atomic-resolution electrochemical scanning tunneling microscopy (ECSTM) measurements. Taking the well-known system of iodine adsorption, we observed distinctly different iodine adlayer structures and surface diffusion behavior on mechanically polished polycrystalline silver electrodes in comparison with those on single-crystal electrodes. The results indicate the need to extend atomic-resolution STM studies to rough surfaces of practical importance. (C) 2000 Published by Elsevier Science B.V. All rights reserved.zh_CN
dc.language.isoenzh_CN
dc.publisherELSEVIER SCIENCE BVzh_CN
dc.subjectscanning tunneling microscopyzh_CN
dc.subjectsolid-liquid interfaceszh_CN
dc.subjectpolycrystalline surfaceszh_CN
dc.subjectsilverzh_CN
dc.subjectsurface structurezh_CN
dc.subjectiodinezh_CN
dc.subjectchemisorptionzh_CN
dc.subjectelectrochemical methodzh_CN
dc.titleExtending an in situ scanning tunneling microscopic study to rough electrode surfaces - iodine adsorption at silver electrodeszh_CN
dc.typeArticlezh_CN


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