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dc.contributor.authorChen, W
dc.contributor.author陈卫
dc.contributor.authorSun, SG
dc.contributor.author孙世刚
dc.date.accessioned2012-05-13T01:58:12Z
dc.date.available2012-05-13T01:58:12Z
dc.date.issued2002
dc.identifier.citationSPECTROSCOPY AND SPECTRAL ANALYSIS,2002,22(3):504-510zh_CN
dc.identifier.issn1000-0593
dc.identifier.urihttps://dspace.xmu.edu.cn/handle/2288/12373
dc.description.abstractSpectral analysis is an important means in studies of nanometer scale system, and is essential for deep understanding the structure and properties of nanometer materials. This paper reviews the recent progresses made in studies of mrionleter materials using spectral analysis methods such as UV-Visible spectroscopy, FTIR spectroscopy, Raman spectroscopy, Mossbauer spectroscopy, position annihilation and photoacoustic spectroscopy. The principle, characteristics and applications of most frequently employed spectral methods are introduced briefly and illustrated with typical examples. Future perspectives of spectral analysis in nanometer field are discussed. New directions of establishing spectral analysis methods at nanometer scale resolution and developing now spectroscopy technology in nanometer material studies are also emphasized.zh_CN
dc.language.isozhzh_CN
dc.publisherBEIJING UNIV PRESSzh_CN
dc.subjectspectral analysiszh_CN
dc.subjectnanometer materialszh_CN
dc.subjectapplicationszh_CN
dc.titleSpectral analysis in nanometer material sciencezh_CN
dc.typeArticlezh_CN


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