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Spectral analysis in nanometer material science

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纳米材料科学中的谱学研究.pdf (353.1Kb)
Date
2002
Author
Chen, W
陈卫
Sun, SG
孙世刚
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  • 化学化工-已发表论文 [14469]
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Abstract
Spectral analysis is an important means in studies of nanometer scale system, and is essential for deep understanding the structure and properties of nanometer materials. This paper reviews the recent progresses made in studies of mrionleter materials using spectral analysis methods such as UV-Visible spectroscopy, FTIR spectroscopy, Raman spectroscopy, Mossbauer spectroscopy, position annihilation and photoacoustic spectroscopy. The principle, characteristics and applications of most frequently employed spectral methods are introduced briefly and illustrated with typical examples. Future perspectives of spectral analysis in nanometer field are discussed. New directions of establishing spectral analysis methods at nanometer scale resolution and developing now spectroscopy technology in nanometer material studies are also emphasized.
Citation
SPECTROSCOPY AND SPECTRAL ANALYSIS,2002,22(3):504-510
URI
https://dspace.xmu.edu.cn/handle/2288/12373

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