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dc.contributor.authorRen, B
dc.contributor.author任斌
dc.contributor.authorLin, XF
dc.contributor.authorYang, ZL
dc.contributor.authorLiu, GK
dc.contributor.authorAroca, RF
dc.contributor.authorMao, BW
dc.contributor.author毛秉伟
dc.contributor.authorTian, ZQ
dc.contributor.author田中群
dc.date.accessioned2012-04-18T01:45:20Z
dc.date.available2012-04-18T01:45:20Z
dc.date.issued2003-07-19
dc.identifier.citationJ. Am. Chem. Soc., 2003, 125 (32): 9598–9599zh_CN
dc.identifier.issn0002-7863
dc.identifier.urihttp://dx.doi.org/doi: 10.1021/ja035541d
dc.identifier.urihttps://dspace.xmu.edu.cn/handle/2288/12113
dc.language.isoenzh_CN
dc.publisherAMER CHEMICAL SOCzh_CN
dc.titleSurface-enhanced Raman scattering in the ultraviolet spectral region: UV-SERS on rhodium and ruthenium electrodeszh_CN
dc.typeArticlezh_CN


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