MgCl_2在SiO_2表面分散状态的表征
Characterization of Dispersed State of MgCl_2 on SiO_2 SurFace
Abstract
以XPS、X-射线粉末衍射和扫描电镜为手段表征了MgCl2在SIO2表面的分散态，结果表明溶剂性质、MgCl2负载量和处理温度是影响分散态的主要因素。 The dispersed state of MgCl2 on SiO2 surFace was characterized by means of XPS、XRD and SEM.Theresults showed that the main Factors of inFluence on dispersed state was solvent property, supported amountof MgCl2 and treatment temperature.